Simultanous AFM/flexQCM system
We offer a novel AFM/QCM system that allows to work both techniques simultaneously.
The atomic force microscope (AFM) is one kind of scanning probe microscopes (SPM) to measure local properties, such as height, friction, magnetism, with a probe. A quartz crystal microbalance measures a mass variation per unit area by measuring the change in frequency of a quartz crystal resonator. These two instrument data can be complimentary or confirmatory. AFM provides information from the surface but QCM take into account whole mass on the sensor.
Technical Specifications
•RT – 110C Temperature Controller with 0.01°C stability
•Open cell liquid circulation support
•Flow rate: 4uL to 1 mL/min
•<100mHz noise in liquid, 1.8 ng/cm2
•Dissipation measurement: proportional to film elasticity